US Patent Issued to CHEP Technology on Oct. 14 for "Pallet inspection system and associated methods" (American, Spanish Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,444,035, issued on Oct. 14, was assigned to CHEP Technology Pty Ltd. (Sydney).

"Pallet inspection system and associated methods" was invented by Khurram Soomro (Ocoee, Fla.), Christopher J. Gerou (Orlando, Fla.), Sergio Conejo (Madrid), Moazam Soomro (Orlando, Fla.) and Gonzalo Vaca Castano (Orlando, Fla.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A pallet inspection system includes a conveyor to move a pallet that is to be inspected. The pallet includes a top deck and a bottom deck separated by spaced apart support blocks positioned therebetween, with nails being used to secure the top and bottom decks to the support blocks. Cameras are positioned ...