US Patent Issued to Chengdu University of Technology on Sept. 15 for "Invasion correction method and system for resistivity logging" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,711, issued on Sept. 15, was assigned to Chengdu University of Technology (Chengdu, China).

"Invasion correction method and system for resistivity logging" was invented by Kesai Li (Chengdu, China), Jiaqi Sun (Chengdu, China), Hucheng Deng (Chengdu, China), Xianhong He (Chengdu, China), Zehou Xiang (Chengdu, China), Hangjie Lin (Chengdu, China), Yanjun Liu (Chengdu, China), Jianhua He (Chengdu, China), Yan Liu (Chengdu, China), Kaicheng Lei (Chengdu, China), Shuoshuo Zhan (Chengdu, China) and Hong Li (Chengdu, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed is an invasion correction method and system for resistivity logging. The meth...