US Patent Issued to Chengdu Sino Microelectronics Technology on Oct. 20 for "Time-interleaved ADC error parameter extraction and correction method" (Chinese Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,771,364, issued on Oct. 20, was assigned to Chengdu Sino Microelectronics Technology Co. Ltd. (Chengdu, China).

"Time-interleaved ADC error parameter extraction and correction method" was invented by Xing Zhu (Chengdu, China), Lei Chen (Chengdu, China), Pintang Kang (Chengdu, China) and Chuanpeng Tang (Chengdu, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A time-interleaved ADC error parameter extraction and correction method relates to an error correction technique for an analog-to-digital converter (ADC). This application discloses a method for extracting and correcting error parameters in a time-interleaved ADC, which takes the time-interleav...