US Patent Issued to CHENGDU AIRCRAFT INDUSTRIAL (GROUP) on March 24 for "Three-dimensional measurement method and system for key morphological feature on aircraft surface, and method for using system" (Chinese Inventors)

ALEXANDRIA, Va., March 24 -- United States Patent no. 12,586,227, issued on March 24, was assigned to CHENGDU AIRCRAFT INDUSTRIAL (GROUP) Co. LTD. (Chengdu, China).

"Three-dimensional measurement method and system for key morphological feature on aircraft surface, and method for using system" was invented by Shuntao Liu (Chengdu, China), Ying Xie (Chengdu, China), Long Yu (Chengdu, China), Jing Xu (Chengdu, China), Jie Li (Chengdu, China), Zhihu Li (Chengdu, China), Liya Han (Chengdu, China), Chun Liu (Chengdu, China), Hongyu Chen (Chengdu, China), Hao Shen (Chengdu, China), Jianchao Fu (Chengdu, China), Long Hao (Chengdu, China) and Changle Tian (Chengdu, China).

According to the abstract* released by the U.S. Patent & Trademark Office: ...