US Patent Issued to CENTRE NATIONAL DE RECHERCHE SCIENTIFIQUE, UNIVERSITE PARIS-SACLAY, CY CERGY PARIS UNIVERSITE on March 24 for "Device for analysing surfaces using fast atom diffraction in a high-pressure environment" (French Inventors)

ALEXANDRIA, Va., March 24 -- United States Patent no. 12,584,872, issued on March 24, was assigned to CENTRE NATIONAL DE RECHERCHE SCIENTIFIQUE (Paris), UNIVERSITE PARIS-SACLAY (Gif-sur-Yvette, France) and CY CERGY PARIS UNIVERSITE (Cergy-Pontoise, France).

"Device for analysing surfaces using fast atom diffraction in a high-pressure environment" was invented by Hocine Khemliche (Viry Chatillon, France), Anouchah Momeni (Boulogne Billancourt, France), Tiberiu Minea (Paris), Elena-Magdalena Staicu-Casagrande (Limours, France) and Sylvain Lupone (Saint Aubin, France).

According to the abstract* released by the U.S. Patent & Trademark Office: "A device for characterizing a surface of a sample, including; -a chamber comprising a medium for th...