ALEXANDRIA, Va., Dec. 23 -- United States Patent no. 12,504,714, issued on Dec. 23, was assigned to CELLOPTIC INC. (Rockville, Md.).
"Optical metrology with incoherent holography" was invented by Gary Brooker (Rockville, Md.) and Nisan Siegel (Silver Spring, Md.).
According to the abstract* released by the U.S. Patent & Trademark Office: "An advance in high-resolution optical metrology has been achieved by the introduction of incoherent holographic imaging. FINCH, an example of incoherent holography, is shown to simplify the process, eliminating many steps in metrology and at the same time increasing throughput, resolution and accuracy of the method. A proposed technique requires only a single image capture with a non-moving camera rather...