US Patent Issued to CARL ZEISS X-RAY MICROSCOPY on Aug. 25 for "X-ray super-resolution assessment via spatial filtering" (California Inventor)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,718,320, issued on Aug. 25, was assigned to CARL ZEISS X-RAY MICROSCOPY INC. (Dublin, Calif.).

"X-ray super-resolution assessment via spatial filtering" was invented by Matthew Andrew (Dublin, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A technique is disclosed for analyzing and displaying the extent to which the images and structures inferred by a physically seeded multiscale network correspond to genuine resolution improvement and the extent to which they correspond to the hallucination of realistic looking structures. A selected reconstruction generated using a trained neural network is compared against a baseline representation (e.g., a ba...