US Patent Issued to Carl Zeiss X-ray Microscopy, Xnovo Technology on March 31 for "Laboratory crystallographic x-ray diffraction analysis system" (British, Danish, German Inventors)

ALEXANDRIA, Va., March 31 -- United States Patent no. 12,590,912, issued on March 31, was assigned to Carl Zeiss X-ray Microscopy Inc. (Dublin, Calif.) and Xnovo Technology ApS (Koege, Denmark).

"Laboratory crystallographic x-ray diffraction analysis system" was invented by Christian Holzner (Wettringen, Germany), Erik Mejdal Lauridsen (Haarlev, Denmark) and Peter Reischig (Leicester, Great Britain).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method and system for three dimensional crystallographic grain orientation mapping for objects. In different examples, subbeams are used that interact with the object at different angles. Other options include rocking the object at different angles during a raster s...