US Patent Issued to Carl Zeiss Microscopy on June 23 for "Measurement techniques for correcting images with extended depth of field" (German, Swiss Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,664,623, issued on June 23, was assigned to Carl Zeiss Microscopy GmbH (Jena, Germany).

"Measurement techniques for correcting images with extended depth of field" was invented by Soren Schmidt (Jena, Germany), Tomas Aidukas (Brugg, Switzerland), Dirk Seidel (Jena, Germany) and Daniel Plohmann (Lauingen, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A computer-implemented method includes receiving a focal image stack. The focal image stack includes multiple images of a measurement object. Each of the images captures a region of a surface of the measurement object with a defined focal plane position in a depth direction. The defined focal plane ...