ALEXANDRIA, Va., May 26 -- United States Patent no. 12,639,816, issued on May 26, was assigned to Carl Zeiss Meditec Inc. (Dublin, Calif.) and Carl Zeiss Meditec AG (Jena, Germany).
"Semi-supervised fundus image quality assessment method using IR tracking" was invented by Homayoun Bagherinia (Dublin, Calif.), Aditya Nair (Dublin, Calif.), Niranchana Manivannan (Dublin, Calif.), Mary Durbin (San Francisco), Lars Omlor (Dublin, Calif.) and Gary Lee (Dublin, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "System/Method/Device for labelling images in an automated manner to satisfy a performance of a different algorithm and then applying active learning to learn a deep learning model which would enable 'rea...