ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,771,791, issued on Oct. 20, was assigned to Canon K.K. (Tokyo).
"Quality inspection system and method" was invented by Kimio Hayashi (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "A quality inspection system includes an information processing device and an image formation system. The information processing device includes an acquisition unit that acquires information relating to a quality inspection device included in the image formation system; a reception unit that receives information relating to quality inspection to be executed by the quality inspection device; a display unit that displays a quality inspection device for executing quality in...