ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,247, issued on Oct. 20, was assigned to CANON K.K. (Tokyo).
"Inspection apparatus and inspection system" was invented by Makoto Anno (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection apparatus according to exemplary embodiments of the present disclosure includes a reception unit configured to receive print data, a registration unit configured to register an image included in the print data as a reference image, an extraction unit configured to extract information relating to a barcode inspection from the received print data, and an inspection unit configured to inspect, when a scanned image generated by scanning a print product is ...