US Patent Issued to CANON on June 16 for "X-ray diagnostic apparatus and X-ray diagnostic system" (Japanese Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,653,630, issued on June 16, was assigned to CANON K.K. (Tokyo).

"X-ray diagnostic apparatus and X-ray diagnostic system" was invented by Akio Tetsuka (Shioyagunshioyamachi, Japan), Masaki Kobayashi (Otawara, Japan), Yoshiyuki Sato (Nasushiobara, Japan), Keisuke Nakamura (Utsunomiya, Japan), Kenji Mizutani (Nasushiobara, Japan), Akihito Takahashi (Nasushiobara, Japan), Shingo Abe (Nasushiobara, Japan) and Mitsuru Sakata (Yaita, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "In one embodiment, an X-ray diagnostic apparatus can communicate with a controller configured to operate a catheter robot capable of moving an inserted device within the object ...