ALEXANDRIA, Va., July 28 -- United States Patent no. 12,695,832, issued on July 28, was assigned to Canon K.K. (Tokyo).
"Inspection apparatus, control method of inspection apparatus, and inspection system" was invented by Takeshi Shinya (Chiba, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection apparatus includes a controller having one or more processors which executes instructions stored in one or more memories, the controller being configured to receive an inspection level that is used in an inspection process of images that have been read by a reading apparatus from images formed on sheets conveyed consecutively from an image formation apparatus by execution of a job; and execute the insp...