US Patent Issued to Canon on July 14 for "X-ray diagnostic apparatus, x-ray condition determination method, and non-transitory computer-readable medium" (Japanese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,678,119, issued on July 14, was assigned to Canon K.K. (Tokyo).

"X-ray diagnostic apparatus, x-ray condition determination method, and non-transitory computer-readable medium" was invented by Masanori Matsumoto (Nasushiobara, Japan), Saki Hashimoto (Nasushiobara, Japan), Keisuke Sugawara (Otawara, Japan), Shingo Abe (Nasushiobara, Japan), Akio Tetsuka (Shioya, Japan), Yusuke Kanno (Sendai, Japan), Yoshiyuki Sato (Nasushiobara, Japan) and Hisayuki Uehara (Otawara, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "According to one embodiment, an X-ray diagnostic apparatus includes processing circuitry. The processing circuitry sets a plurality of ROIs ...