US Patent Issued to Calterah Semiconductor Technology (Shanghai) on April 7 for "Delay calibration circuit and method, analog-to-digital converter, radar sensor, and device" (Chinese Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,941, issued on April 7, was assigned to Calterah Semiconductor Technology (Shanghai) Co. Ltd. (Shanghai).

"Delay calibration circuit and method, analog-to-digital converter, radar sensor, and device" was invented by Xinlong Zhang (Shanghai) and Wenting Zhou (Shanghai).

According to the abstract* released by the U.S. Patent & Trademark Office: "A delay calibration circuit and method, an analog-to-digital converter, a radar sensor, and a device are provided. The delay calibration circuit monitors a timing relationship between signals in a chip in real time to extract PVT information, dynamically adjusts conversion timing of an asynchronous SAR ADC, maximally utilizes an available c...