US Patent Issued to Calterah Semiconductor Technology (Shanghai) on April 7 for "Antenna in package, radio frequency chip, test device and test method" (Chinese Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,598,006, issued on April 7, was assigned to Calterah Semiconductor Technology (Shanghai) Co. Ltd. (Shanghai).

"Antenna in package, radio frequency chip, test device and test method" was invented by Shan Li (Shanghai), Kaijie Zhuang (Shanghai), Zhefan Chen (Shanghai), Xuejuan Huang (Shanghai) and Dian Wang (Shanghai).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure provides an antenna in package, a RF chip, a test device and a test method. The antenna in package includes at least one antenna, one or more coupling structures and at least one testing terminal. The at least one antenna, the one or more coupling structures and the at leas...