US Patent Issued to California Institute of Technology, TOTALENERGIES ONETECH on Oct. 27 for "Systems and methods for monitoring the surface temperature of an object using the temperature-dependent absorption properties of semiconductors" (American, French Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,774,928, issued on Oct. 27, was assigned to California Institute of Technology (Pasadena, Calif.) and TOTALENERGIES ONETECH (Courbevoie, France).

"Systems and methods for monitoring the surface temperature of an object using the temperature-dependent absorption properties of semiconductors" was invented by Axel Scherer (Barnard, Vt.), Jack Jewell (Boulder, Colo.), John Richard Ordonez-Varela (Lescar, France) and Paromita Mitchell (Pasadena, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A temperature monitoring system includes a semiconductor member mounted onto the surface of an object having a surface whose temperature is to be monitored. The s...