US Patent Issued to California Institute of Technology, TotalEnergies E&P Research & Technology USA on Sept. 15 for "Leak-detection system and methods for leak detection" (American, French Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,434, issued on Sept. 15, was assigned to California Institute of Technology (Pasadena, Calif.) and TotalEnergies E&P Research & Technology USA Inc. (Courbevoie, France).

"Leak-detection system and methods for leak detection" was invented by Axel Scherer (Barnard, Vt.), Taeyoon Jeon (Pasadena, Calif.), Changsoon Choi (Pasadena, Calif.), Peter A Petillo (Lawrence, Kan.), Jack Jewell (Boulder, Colo.) and John Richard Ordonez-Varela (Lescar, France).

According to the abstract* released by the U.S. Patent & Trademark Office: "A leak-detection system comprises networked imaging packages including an infrared camera based on microbolometer arrays, one or more filters, and a processor. ...