ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,346, issued on July 21, was assigned to Cadence Design Systems Inc. (San Jose, Calif.).

"Method and apparatus for mutation coverage testing with incremental sat queries" was invented by Guy Wolfovitz (Haifa, Israel), Ramanuj Chouksey (Noida, India), Amit Verma (Noida, India) and Habeeb Anton Farah (Haifa, Israel).

According to the abstract* released by the U.S. Patent & Trademark Office: "A solution for performing incremental mutation coverage testing is disclosed. The solution can identify, for a cycle of a test, a first signal not covered during preceding cycles of the test and select, for the current cycle, a first value for the first signal. The solution can, responsive to th...