US Patent Issued to Bruker Nano on Nov. 3 for "Handheld X-ray fluorescence, XRF, analyzer and a method for elemental analysis with a handheld XRF analyzer" (German Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,302, issued on Nov. 3, was assigned to Bruker Nano GmbH (Berlin).

"Handheld X-ray fluorescence, XRF, analyzer and a method for elemental analysis with a handheld XRF analyzer" was invented by Tim Heek (Kranenburg, Germany) and Timo Wolff (Berlin).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure refers to a handheld X-ray fluorescence, XRF, analyzer (1). The XRF analyzer (1) comprises a radiation source assembly (10) configured to irradiate a sample (40) to be tested with an X-ray beam (105), a radiation detector assembly (20) configured to detect a first X-Ray fluorescence, XRF, radiation (205) emitted from the sample (40) in resp...