ALEXANDRIA, Va., April 15 -- United States Patent no. 12,603,246, issued on April 14, was assigned to BRUKER NANO GMBH (Berlin).
"Detector and method for obtaining Kikuchi images" was invented by Uwe Rossek (Berlin).
According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention refers to a detector and a method for obtaining Kikuchi images by using electron backscatter diffraction (EBSD) or transmission Kikuchi diffraction (TKD) technique. In particular, the present invention refers to a detector comprising a detector body, a detector head with a scintillation screen and a photodetector with a active surface for detecting Kikuchi patterns, and means configured to move the detector head with respect to t...