ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,546,588, issued on Feb. 10, was assigned to Brookhaven Science Associates LLC (Upton, N.Y.).
"Collimated phase measuring deflectometry" was invented by Lei Huang (Stony Brook, N.Y.), Mourad Idir (South Setauket, N.Y.) and Tianyi Wang (Ridge, N.Y.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Various examples relate to collimated phase measuring deflectometry. In one example, is a collimated phase measuring deflectometer system with a screen that emits a structured light pattern; a collimation optical system comprising a Fourier lens positioned such that the structured light pattern passes through the collimation optical system; a beam splitter position...