US Patent Issued to Bormans Beheer on June 2 for "Method and apparatus for preparing samples under cryogenic conditions for imaging or diffraction experiments in an electron microscope" (Dutch Inventors)

ALEXANDRIA, Va., June 2 -- United States Patent no. 12,644,802, issued on June 2, was assigned to Bormans Beheer B.V. (Eindhoven, Netherlands).

"Method and apparatus for preparing samples under cryogenic conditions for imaging or diffraction experiments in an electron microscope" was invented by Bernardus Jacobus Marie Bormans (Eindhoven, Netherlands) and Ronald Arthur Marx (Veldhoven, Netherlands).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method and apparatus for preparing samples for imaging under cryogenic conditions or diffraction experiments under cryogenic conditions in an electron microscope. One version of the method involves: partially submerging a flat sample carrier with sample material vert...