ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,240, issued on Oct. 20, was assigned to Boon Logic Inc. (Minneapolis).
"Product inspection system and method" was invented by Brian Turnquist (Arden Hills, Minn.), Iesha Latty (Golden Valley, Minn.), Elise Courtemanche (Minneapolis) and Rodney Dockter (Plymouth, Minn.).
According to the abstract* released by the U.S. Patent & Trademark Office: "The present application discloses a product inspection system or method having application for detecting defective product. In illustrated embodiments the system utilizes an input product image to detect defects in product. As disclosed, a vector generator creates a gray scale data vector representing a number of pixels having an associate...