US Patent Issued to BOE Technology Group on Jan. 20 for "Method for measuring actual area of defect, and method and apparatus for testing display panel" (Chinese Inventors)

ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,530,762, issued on Jan. 20, was assigned to BOE Technology Group Co. Ltd. (Beijing).

"Method for measuring actual area of defect, and method and apparatus for testing display panel" was invented by Wangqiang He (Beijing), Yiwen Ding (Beijing), Yuanyuan Lu (Beijing), Dong Chai (Beijing) and Hong Wang (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method and apparatus for measuring the actual area of a defect, and a method and apparatus for testing a display panel. The method for measuring the actual area of a defect includes: acquiring a measurement image of a display panel, wherein the measurement image has a defect region; according to the m...