US Patent Issued to BOE Technology Group on April 7 for "Method and apparatus for identifying defect grade of bad picture, and storage medium" (Chinese Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,106, issued on April 7, was assigned to BOE Technology Group Co. Ltd. (Beijing).

"Method and apparatus for identifying defect grade of bad picture, and storage medium" was invented by Quanguo Zhou (Beijing), Kaiqin Xu (Beijing), Jiahong Zou (Beijing), Guolin Zhang (Beijing), Xun Huang (Beijing), Qing Zhang (Beijing), Lijia Zhou (Beijing), Zhidong Wang (Beijing), Hongxiang Shen (Beijing), Hao Tang (Beijing) and Jiuyang Cheng (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are a method and apparatus for identifying the defect grade of a bad picture, and a storage medium. The method includes: determining the defect size of a defect fro...