US Patent Issued to BEIJING JIAOTONG UNIVERSITY on July 14 for "Method for simultaneously measuring multi DOF GEs by laser and system therefor" (Chinese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,175, issued on July 14, was assigned to BEIJING JIAOTONG UNIVERSITY (Beijing).

"Method for simultaneously measuring multi DOF GEs by laser and system therefor" was invented by Qibo Feng (Beijing), Fajia Zheng (Beijing), Jiakun Li (Beijing), Bin Zhang (Beijing), Jing Yang (Beijing), Yuqiong Zhao (Beijing) and Peizhi Jia (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method and system for simultaneously measuring multiple DOF GEs by a laser. The system comprises a measuring unit and a target mirror unit; the measuring unit comprises a laser emitting module, a polarizing beam splitter, a fixed reflector, a first Lambda/4 wave plate, a second...