US Patent Issued to Beijing ESWIN Computing Technology, Guangzhou Transa Semi Information Technology on Feb. 10 for "GRPC-based chip test method, GRPC-based chip test apparatus, and storage medium" (Chinese Inventors)

ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,546,822, issued on Feb. 10, was assigned to Beijing ESWIN Computing Technology Co. Ltd. (Beijing) and Guangzhou Transa Semi Information Technology Co. Ltd. (Guangzhou, China).

"GRPC-based chip test method, GRPC-based chip test apparatus, and storage medium" was invented by Zeliang Xie (Beijing), Yufeng Peng (Beijing), Zuhua Shi (Beijing), Ligang Yuan (Beijing) and Huichuang Ma (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "Embodiments of the present application provide a GRPC-based chip test method, a GRPC-based chip test apparatus, and a storage medium. The GRPC-based chip test method comprises: determining a number of to-be-tested chips that ...