US Patent Issued to BAE Systems Information and Electronic Systems Integration on Sept. 1 for "Generalized likelihood ratio test for dual band imagery" (New Hampshire, Massachusetts Inventors)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,725,385, issued on Sept. 1, was assigned to BAE Systems Information and Electronic Systems Integration Inc. (Nashua, N.H.).

"Generalized likelihood ratio test for dual band imagery" was invented by Benjamin P. Wood (Bedford, Mass.), Jeffrey A. Wallace (Nashua, N.H.) and Marc J. Fredette (Manchester, N.H.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A passive sensor having a focal plane array with a plurality of pixels captures at least one dual band image. A generalized likelihood ratio test can be applied to the dual band imagery using intermediate images and image kernels or filters to approximate signal detections rather than performing a brute for...