ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,535,500, issued on Jan. 27, was assigned to AWESOMENICS INC. (Asan-si, South Korea).
"Test pin" was invented by Woo Yoel Jeong (Cheonan-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a test pin for inspecting the presence of an electrical defect in a semiconductor and a camera module, the test pin comprising: a top plunger which is in contact with an object to be inspected to transmit an electrical signal thereto, and detects an output signal output from the object to be inspected; and a bottom plunger which transmits, to the top plunger, an electrical signal received from inspection equipment and transmits, to the inspection...