US Patent Issued to Auradine on Aug. 4 for "Built-in self-test for on-chip error detection" (Texas Inventor)

ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,699,132, issued on Aug. 4, was assigned to Auradine Inc. (Santa Clara, Calif.).

"Built-in self-test for on-chip error detection" was invented by David Carlson (Haslet, Texas).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure generally relates to using built-in self-test (BIST) for on-chip error detection. In some aspects, a method includes receiving information about one or more parameters for a built-in self-test (BIST) operation, generating a nonce for each iteration of the BIST operation according to the one or more parameters, and computing a hash value for each iteration of the BIST operation using the nonce as an input to a crypt...