ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,474,398, issued on Nov. 18, was assigned to ATECO INC. (Gunpo-si, South Korea).
"Test board capable of regulating testing temperature of semiconductor devices" was invented by Taek Seon Lee (Hwaseong-si, South Korea) and Ho Nam Kim (Seongnam-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "A test board for semiconductor devices is provided which contains a plurality of semiconductor devices and is loaded into a testing apparatus. The test board includes: a receiving part formed with a plurality of semiconductor device receiving grooves that respectively receive a plurality of semiconductor devices; and a lid part removably attached to the ...