ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,945, issued on Sept. 8, was assigned to AT&T Intellectual Property I LP (Atlanta).

"Feature selection method and system for regression analysis / model construction" was invented by Vladimir Sevastyanov (Fort Worth, Texas), Abhay Dabholkar (Allen, Texas), Rakhi Gupta (Frisco, Texas), James H. Pratt (Round Rock, Texas) and Nikhlesh Agrawal (McKinney, Texas).

According to the abstract* released by the U.S. Patent & Trademark Office: "Aspects of the subject disclosure may include, for example, dividing a feature range of a feature into a plurality of subsets that span the feature range, calculating an average target variable value for each subset of the plurality of subsets, resulti...