US Patent Issued to ASML Netherlands on Aug. 4 for "Manipulator, manipulator array, charged particle tool, multi-beam charged particle tool, and method of manipulating a charged particle beam" (Dutch Inventors)

ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,700,561, issued on Aug. 4, was assigned to ASML Netherlands B.V. (Veldhoven, Netherlands).

"Manipulator, manipulator array, charged particle tool, multi-beam charged particle tool, and method of manipulating a charged particle beam" was invented by Laura Dinu Gurtler (Delft, Netherlands) and German Aksenov (Delft, Netherlands).

According to the abstract* released by the U.S. Patent & Trademark Office: "A manipulator for manipulating a charged particle beam in a projection system, the manipulator comprising a substrate having opposing major surfaces in each of which is defined an aperture and a through-passage having an interconnecting surface extending between the apertures; wherein t...