ALEXANDRIA, Va., April 21 -- United States Patent no. 12,610,629, issued on April 21, was assigned to ASML Netherlands B.V. (Veldhoven, Netherlands).

"Charged-particle detector package for high speed applications" was invented by Yongxin Wang (San Ramon, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A charged particle beam system may include a detector. A package for a detector may have a package body that includes two sets of pins, each of the sets of pins including two pins. Each pin of the sets of pins may be configured to be connected to one of two terminals of a sensing element. Pins of different sets may be configured to be connected to a different one of the two terminals of the diode. The set...