US Patent Issued to ARKRAY on Sept. 8 for "Measurement device" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,086, issued on Sept. 8, was assigned to ARKRAY Inc. (Kyoto, Japan).

"Measurement device" was invented by Hiroki Arima (Kyoto, Japan), Oki Sato (Tokyo) and Shun Naruse (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a measurement device that measures a specimen using a sheet-shaped sensor. The measurement device includes: a main body portion in which an insertion port into which the sensor is inserted is formed and a measurement unit that executes measurement related to the specimen is provided; and a movable portion that is movable with respect to the main body portion in a direction along a sheet surface of the sensor in a state o...