US Patent Issued to ARKRAY on Oct. 20 for "Measurement system" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,809, issued on Oct. 20, was assigned to ARKRAY Inc. (Kyoto, Japan).

"Measurement system" was invented by Gai Go (Kyoto, Japan) and Atsushi Murakami (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A measurement system including a sensor and a measurement device including an insertion port for the sensor, wherein the measurement device measures a measurement target component at the sensor and includes plural terminals contacting the sensor, and the terminals slide on a contact surface of the sensor, the contact surface has a first electrode group on a rear end side and a second electrode group on a distal end side, the plural terminals re...