US Patent Issued to ARKRAY on March 3 for "Measurement device, measurement system, measurement method, and measurement program" (Japanese Inventor)

ALEXANDRIA, Va., March 3 -- United States Patent no. 12,568,362, issued on March 3, was assigned to ARKRAY Inc. (Kyoto, Japan).

"Measurement device, measurement system, measurement method, and measurement program" was invented by Yutaka Kawabata (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A measurement device comprising: a processor; and a memory configured to store a program executed by the processor cause the measurement device to: first advertisement process for establishing a communication between a host device and a communication device by transmitting first advertisement information to the communication terminal, the first advertisement information including first state information ind...