ALEXANDRIA, Va., Dec. 16 -- United States Patent no. D1,106,482, issued on Dec. 16, was assigned to ARKRAY Inc. (Kyoto, Japan).
"Specimen analysis apparatus" was invented by Kenya Hara (Tokyo), Chiyong Kim (Chiba, Japan) and Kanako Ohashi (Tokyo).
The patent was filed on Aug. 22, 2024, under Application No. D/958,881.
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