US Patent Issued to APPLIED MATERIALS on July 28 for "Inspection system" (Israeli, German Inventors)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,696,717, issued on July 28, was assigned to APPLIED MATERIALS Inc. (Santa Clara, Calif.).

"Inspection system" was invented by Asaf Schlezinger (Modi'in, Israel) and Markus J. Stopper (Voerstetten, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "Embodiments herein generally relate to inspection systems for substrates or wafers for solar cell applications. The inspection system is configured to analyze substrates or wafers for chips, cracks, and other defects. The system includes conveyor apparatuses, and the conveyor apparatuses include one or more conveyor elements. The conveyor elements are configured to transport rectangular wafers having a wid...