US Patent Issued to Applied Materials on Feb. 24 for "Method of imaging a sample with a charged particle beam device, method of calibrating a charged particle beam device, and charged particle beam device" (German Inventors)

ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,562,336, issued on Feb. 24, was assigned to Applied Materials Inc. (Santa Clara, Calif.).

"Method of imaging a sample with a charged particle beam device, method of calibrating a charged particle beam device, and charged particle beam device" was invented by Kulpreet Singh Virdi (Munich), Bernhard G. Mueller (Finsing, Germany) and Bernhard Schuler (Munich).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of imaging a sample with a charged particle beam device, comprising: determining a first focusing strength of an objective lens of the charged particle beam device, the first focusing strength being adapted to focus a charged particle beam on a fi...