US Patent Issued to Applied Materials on Aug. 4 for "Determining substrate characteristics by virtual substrate measurement" (Indian, American Inventors)

ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,699,824, issued on Aug. 4, was assigned to Applied Materials Inc. (Santa Clara, Calif.).

"Determining substrate characteristics by virtual substrate measurement" was invented by Dheeraj Kumar (San Jose, Calif.), Samit Barai (Chennai, India), Pardeep Kumar (Greater Noida, India), Sundar Narayanan (Cupertino, Calif.) and Anantha Sethuraman (Palo Alto, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method includes receiving feature data defining a plurality of features of a virtual substrate. The method further includes preparing the virtual substrate for display on a graphical user interface (GUI). The method further includes receiving one or more...