US Patent Issued to Applied Materials Israel on July 28 for "Precision in stereoscopic measurements using a pre-deposition layer" (Israeli Inventor)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,695,054, issued on July 28, was assigned to Applied Materials Israel Ltd. (Rehovot, Israel).

"Precision in stereoscopic measurements using a pre-deposition layer" was invented by Yehuda Zur (Tel-Aviv, Israel).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of determining the depth of a hole milled into a first region of a sample, the method comprising: positioning the sample in a processing chamber having a charged particle beam column; depositing material directly over a top surface of the sample in a second region of the sample adjacent to the first region; milling the hole in the first region of the sample using a charged particle beam generat...