US Patent Issued to Applied Materials Israel on July 15 for "Machine learning-based classification of defects in a semiconductor specimen" (Israeli Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,361,531, issued on July 15, was assigned to Applied Materials Israel Ltd. (Rehovot, Israel).

"Machine learning-based classification of defects in a semiconductor specimen" was invented by Ohad Shaubi (Yavne, Israel), Boaz Cohen (Lehavim, Israel), Kirill Savchenko (Lod, Israel) and Ore Shtalrid (Yavne, Israel).

According to the abstract* released by the U.S. Patent & Trademark Office: "There is provided a method of automated defects' classification, and a system thereof. The method comprises obtaining data informative of a set of defects' physical attributes usable to distinguish between defects of different classes among the plurality of classes; training a first machine learning mod...