ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,548,637, issued on Feb. 10, was assigned to Apple Inc. (Cupertino, Calif.).
"Parallel timing margin testing of memory devices" was invented by Romi Madilao (Cupertino, Calif.) and Jaret R. Stillman (Cupertino, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure describes systems and methods for determining timing margins in parallel for a plurality of byte lanes coupling a memory device to a memory controller circuit. Memory testing can be performed on multiple byte lanes in parallel to detect a memory test failure event for one or more failing byte lanes. In response to detecting the memory test failure event for the one or mor...