US Patent Issued to Apple on Feb. 10 for "Layer 1 and layer 3 measurement coordination" (German, American, Chinese Inventors)

ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,549,237, issued on Feb. 10, was assigned to Apple Inc. (Cupertino, Calif.).

"Layer 1 and layer 3 measurement coordination" was invented by Jie Cui (San Jose, Calif.), Yang Tang (San Jose, Calif.), Yihong Qi (Santa Clara, Calif.), Herbert R Dawid (Herzogenrath, Germany), Panagiotis Botsinis (Munich), Dawei Zhang (Saratoga, Calif.), Hong He (San Jose, Calif.), Manasa Raghavan (Sunnyvale, Calif.), Qiming Li (Beijing) and Xiang Chen (Campbell, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A user equipment (UE) may be configured to perform layer 1 (L1) measurement procedures and layer 3 (L3) measurement procedures. The UE configures a channel state i...