US Patent Issued to ANRITSU on Sept. 8 for "Measurement apparatus" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,176, issued on Sept. 8, was assigned to ANRITSU Corp. (Kanagawa, Japan).

"Measurement apparatus" was invented by Takashi Iwase (Kanagawa, Japan), Yuki Kondo (Kanagawa, Japan) and Chunqing Liang (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "To provide a measurement apparatus capable of simplifying a test configuration and reducing cost. A measurement apparatus includes a measurement unit 2 that measures an RF signal received from a DUT 20, a signal generation unit 3 that generates and transmits a test RF signal to be transmitted to the DUT 20, and a 1-PPS signal generation unit 4 that generates a 1-PPS signal for synchronization of ...