US Patent Issued to ANRITSU on Oct. 20 for "X-ray generator and X-ray inspection apparatus including the same" (Japanese Inventor)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,772,364, issued on Oct. 20, was assigned to ANRITSU Corp. (Kanagawa, Japan).

"X-ray generator and X-ray inspection apparatus including the same" was invented by Jyunichi Moriya (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "There is provided an X-ray generator and an X-ray inspection apparatus including the same, which can achieve miniaturization and weight reduction. An X-ray tube that generates X-rays, a high-voltage circuit substrate that applies a high tube voltage to the X-ray tube, and a housing which is filled with an insulating oil and in which the X-ray tube and the high-voltage circuit substrate are accommodated, in which a sh...