US Patent Issued to ANRITSU on May 12 for "Measurement device and measurement method" (Japanese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,628,014, issued on May 12, was assigned to ANRITSU Corp. (Atsugi, Japan).

"Measurement device and measurement method" was invented by Takahiro Kasagi (Atsugi, Japan), Koichi Inoue (Atsugi, Japan) and Hiroyuki Tanikage (Atsugi, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A measurement device includes: a display unit that displays information related to a test; a device control unit group that includes a plurality of device control units controlling control target devices of a control target device group, respectively, the control target device group including the control target devices that each simulate the component of the component group, resp...